Optimization and Characterization of CuO Thin Films
Mohammed Ibrahim Ismael
Department of Physics, College of Education for Pure Science, Mosul University, Iraq.
Ghazwan Ghazi Ali
*
Department of Physics, College of Education for Pure Science, Mosul University, Iraq.
*Author to whom correspondence should be addressed.
Abstract
This study is focused on the structural and optical properties of CuO thin films carried by spray pyrolysis deposition method. The deposited films were examined using X-ray diffraction, Scanning electron microscope, Atomic force microscope, Raman spectroscope and UV- spectrophotometer. The XRD pattern showed that the as-deposited CuO thin film has monoclinic and polycrystalline structure. Morphological properties SEM &AFM images exhibit that the obtained films have a good uniform distribution and high surface roughness with increasing temperature substrate. The Raman scattering exhibits three modes of peak position A1g, B1g, and B2g.It can be seen, the Raman shift increases with increasing temperature. CuO thin films have a good absorption coefficient values, the high value of the absorbance refers to the possibility of direct transitions and the material optical band gap has been determined to be between (1.45 -1.60 eV). The characterization of CuO thin films can be enhanced with increasing temperature. The optimization of the deposited films depends on fabrication conditions.
Keywords: CuO thin films, XRD, SEM & AFM characterization, raman spectroscopy, UV spectrophotometer